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[IEEE 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Cannes, France (10-13 Oct. 2004)] 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Annotated bit flip fault model

✍ Scribed by Favalli, M.

Book ID: 126638224
Publisher: IEEE
Year: 2004
Weight: 877 KB
Category: Article
ISBN-13: 9780769522418
DOI: 10.1109/DFTVS.2004.1347861

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