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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Computing cache vulnerability to transient errors and its implication

✍ Scribed by Wei Zhang,

Book ID: 118119340
Publisher: IEEE Comput. Soc
Year: 2005
Weight: 236 KB
Volume: 0
Category: Article
ISBN-13: 9780769524641
DOI: 10.1109/dftvs.2005.23

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