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[IEEE Comput. Soc 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Paris, France (20-22 Oct. 1997)] 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Multiple fault detection in logic resources of FPGAs

✍ Scribed by Wei Liang Huang, ; Meyer, F.J.; Lombardi, F.

Book ID: 115479085
Publisher: IEEE Comput. Soc
Year: 1997
Weight: 523 KB
Volume: 0
Category: Article
ISBN-13: 9780818681684
DOI: 10.1109/dftvs.1997.628324

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