𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - A unified approach for off-line and on-line testing of VLSI systems

✍ Scribed by Lala, P.K.; Yang, S.; Busaba, F.

Book ID: 126058888
Publisher: IEEE Comput. Soc. Press
Year: 1996
Weight: 387 KB
Category: Article
ISBN-13: 9780818675454
DOI: 10.1109/DFTVS.1996.572025

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📜 SIMILAR VOLUMES

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