𝔖 Bobbio Scriptorium

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[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Trade-offs between yield and reliability enhancement [VLSI]

✍ Scribed by Venkataraman, A.; Koren, I.

Book ID: 126750556
Publisher: IEEE Comput. Soc. Press
Year: 1996
Weight: 501 KB
Category: Article
ISBN-13: 9780818675454
DOI: 10.1109/DFTVS.1996.571993

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