𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Integration of DFM techniques and design automation

✍ Scribed by Waring, T.G.; Allan, G.A.; Walton, A.I.

Book ID: 126769283
Publisher: IEEE Comput. Soc. Press
Year: 1996
Weight: 538 KB
Category: Article
ISBN-13: 9780818675454
DOI: 10.1109/DFTVS.1996.571991

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📜 SIMILAR VOLUMES

[IEEE Comput. Soc. Press Proceedings. 19

[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Comprehensive modeling of VLSI test

✍ Ziaja, T.; Swartzlander, E. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 346 KB

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✍ Venkataraman, A.; Koren, I. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 501 KB

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[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - A unified approach for off-line and on-line testing of VLSI systems

✍ Lala, P.K.; Yang, S.; Busaba, F. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 387 KB

[IEEE Comput. Soc. Press Proceedings. 19

[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Optimising high-level synthesis for self-checking arithmetic circuits

✍ Antola, A.; Piuri, V.; Sami, M. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 503 KB

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[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Error identification and data retrieval in signature analysis based data compaction

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[IEEE Comput. Soc. Press Proceedings. 19

[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays

✍ Chapman, G.H.; Dufort, B. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 395 KB