𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc. Press Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (6-8 Nov. 1996)] Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Comprehensive modeling of VLSI test

✍ Scribed by Ziaja, T.; Swartzlander, E.

Book ID: 126675897
Publisher: IEEE Comput. Soc. Press
Year: 1996
Weight: 346 KB
Category: Article
ISBN-13: 9780818675454
DOI: 10.1109/DFTVS.1996.572021

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