𝔖 Bobbio Scriptorium

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[IEEE Comput. Soc 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Albuquerque, NM, USA (1-3 Nov. 1999)] Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) - Fault-tolerant refresh power reduction of DRAMs for quasi-nonvolatile data retention

✍ Scribed by Katayama, Y.; Stuckey, E.J.; Morioka, S.; Wu, Z.

Book ID: 118228444
Publisher: IEEE Comput. Soc
Year: 1999
Tongue: English
Weight: 87 KB
Volume: 0
Category: Article
ISBN-13: 9780769503257
DOI: 10.1109/dftvs.1999.802898

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