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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - BIST-aided scan test - a new method for test cost reduction

✍ Scribed by Hiraide, T.; Kwame Osei Boateng, ; Konishi, H.; Itaya, K.; Emori, M.; Yamanaka, H.; Mochiyama, T.

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