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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Efficient seed utilization for reseeding based compression [logic testing]

✍ Scribed by Volkerink, E.H.; Mitra, S.

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