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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Deterministic test vector decompression in software using linear operations [SOC testing]

โœ Scribed by Balakrishnan, K.J.; Touba, N.A.


Book ID
126633968
Publisher
IEEE Comput. Soc
Year
2003
Weight
788 KB
Category
Article
ISBN-13
9780769519241

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