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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - A reconfigurable shared scan-in architecture

✍ Scribed by Samaranayake, S.; Gizdarski, E.; Sitchinava, N.; Neuveux, F.; Kapur, R.; Williams, T.W.

Book ID: 118067123
Publisher: IEEE Comput. Soc
Year: 2003
Tongue: English
Weight: 286 KB
Volume: 0
Category: Article
ISBN-13: 9780769519241
DOI: 10.1109/vtest.2003.1197627

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