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[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Reconfiguration technique for reducing test time and test data volume in Illinois Scan Architecture based designs

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✍ Reddy, S.M.; Miyase, K.; Kajihara, S.; Pomeranz, I. 📂 Article 📅 2002 🏛 IEEE Comput. Soc ⚖ 257 KB