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[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - On test data volume reduction for multiple scan chain designs

✍ Scribed by Reddy, S.M.; Miyase, K.; Kajihara, S.; Pomeranz, I.

Book ID: 118057641
Publisher: IEEE Comput. Soc
Year: 2002
Weight: 257 KB
Volume: 0
Category: Article
ISBN-13: 9780769515700
DOI: 10.1109/vts.2002.1011119

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