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[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Test vector compression using EDA-ATE synergies

✍ Scribed by Khoche, A.; Volkerink, E.; Rivoir, J.; Mitra, S.

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