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[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - An industrial environment for high-level fault-tolerant structures insertion and validation

โœ Scribed by Berrojo, L.; Corno, F.; Entrena, L.; Gonzalez, I.; Lopez, C.; Sonza Reorda, M.; Squillero, G.


Book ID
120069874
Publisher
IEEE Comput. Soc
Year
2002
Weight
346 KB
Category
Article
ISBN-13
9780769515700

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