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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Test generation for maximizing ground bounce considering circuit delay

✍ Scribed by Yi-Shing Chang, ; Gupta, S.K.; Breuer, M.A.

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