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[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - An optimized BIST test pattern generator for delay testing

✍ Scribed by Girard, P.; Landrault, C.; Moreda, V.; Pravossoudovitch, S.

Book ID: 118221414
Publisher: IEEE Comput. Soc. Press
Year: 1997
Weight: 707 KB
Volume: 0
Category: Article
ISBN-13: 9780818678103
DOI: 10.1109/vtest.1997.599448

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