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[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - High quality robust tests for path delay faults

✍ Scribed by Liang-Chi Chen, ; Gupta, S.K.; Breuer, M.A.

Book ID: 120640631
Publisher: IEEE Comput. Soc. Press
Year: 1997
Weight: 673 KB
Category: Article
ISBN-13: 9780818678103
DOI: 10.1109/VTEST.1997.599447

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