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[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Test synthesis for DC test and maximal diagnosis of switched-capacitor circuits

✍ Scribed by Dufaza, C.; IHS, H.

Book ID: 121837100
Publisher: IEEE Comput. Soc. Press
Year: 1997
Weight: 901 KB
Category: Article
ISBN-13: 9780818678103
DOI: 10.1109/VTEST.1997.600284

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