𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Exact probabilistic analysis of error detection for parity checkers

✍ Scribed by Vardanian, V.A.

Book ID: 126750926
Publisher: IEEE Comput. Soc. Press
Year: 1997
Weight: 579 KB
Category: Article
ISBN-13: 9780818678103
DOI: 10.1109/VTEST.1997.600276

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc. Press Proceedings. 15

[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Self-exercising self testing k-order comparators

✍ Kavousianos, X.; Nikolos, D. 📂 Article 📅 1997 🏛 IEEE Comput. Soc. Press ⚖ 566 KB

[IEEE Comput. Soc. Press Proceedings. 15

[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - An optimized BIST test pattern generator for delay testing

✍ Girard, P.; Landrault, C.; Moreda, V.; Pravossoudovitch, S. 📂 Article 📅 1997 🏛 IEEE Comput. Soc. Press ⚖ 707 KB

[IEEE Comput. Soc. Press Proceedings. 15

[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Experimental fault analysis of 1 Mb SRAM chips

✍ Goto, H.; Nakamura, S.; Iwasaki, K. 📂 Article 📅 1997 🏛 IEEE Comput. Soc. Press ⚖ 540 KB

[IEEE Comput. Soc. Press Proceedings. 15

[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - High quality robust tests for path delay faults

✍ Liang-Chi Chen, ; Gupta, S.K.; Breuer, M.A. 📂 Article 📅 1997 🏛 IEEE Comput. Soc. Press ⚖ 673 KB

[IEEE Comput. Soc. Press Proceedings. 15

[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Fast algorithms for static compaction of sequential circuit test vectors

✍ Nsiao, M.S.; Rudnick, E.M.; Patel, J.H. 📂 Article 📅 1997 🏛 IEEE Comput. Soc. Press ⚖ 834 KB

[IEEE Comput. Soc. Press Proceedings. 15

[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Using ATPG for clock rules checking in complex scan designs

✍ Wohl, P.; Waicukauski, J. 📂 Article 📅 1997 🏛 IEEE Comput. Soc. Press ⚖ 756 KB