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[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Using ATPG for clock rules checking in complex scan designs

✍ Scribed by Wohl, P.; Waicukauski, J.

Book ID: 120074706
Publisher: IEEE Comput. Soc. Press
Year: 1997
Weight: 756 KB
Category: Article
ISBN-13: 9780818678103
DOI: 10.1109/VTEST.1997.599463

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