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[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs

✍ Scribed by Lou, C.L.; Chim, W.K.; Chan, D.S.H.; Pan, Y.

Book ID: 126764690
Publisher: IEEE
Year: 1995
Weight: 383 KB
Category: Article
ISBN-13: 9780780327979
DOI: 10.1109/IPFA.1995.487601

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