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[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - A study of integrated circuit I-V characteristics using a fault localization system [FLS]

✍ Scribed by Quah, L.T.S.; Wong, W.K.; Phang, J.C.H.; Chan, D.S.H.; Ho, P.Y.S.

Book ID: 126667862
Publisher: IEEE
Year: 1995
Weight: 512 KB
Category: Article
ISBN-13: 9780780327979
DOI: 10.1109/IPFA.1995.487599

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