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[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - The related effects of increased PN junction area on ESD protection capability

✍ Scribed by Liu Po-Ching, ; Lee, B.; Eng Aik Lian, ; Gan Cheong Hock, ; Wang Haibo,

Book ID: 126648837
Publisher: IEEE
Year: 1995
Weight: 651 KB
Category: Article
ISBN-13: 9780780327979
DOI: 10.1109/IPFA.1995.487607

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