𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - A new interlayer dielectric (ILD) cracking mechanism in ceramic packaged multilayered CMOS devices

✍ Scribed by Yeoh Eng Hong, ; Chong Aik Kean, ; Tay, R.

Book ID: 126652018
Publisher: IEEE
Year: 1995
Weight: 262 KB
Category: Article
ISBN-13: 9780780327979
DOI: 10.1109/IPFA.1995.487610

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 5th International Symposium on the

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability testing of GaAs MMICs

✍ Anderson, W.T.; Roussos, J.A.; Christianson, K.A. 📂 Article 📅 1995 🏛 IEEE ⚖ 242 KB

[IEEE 5th International Symposium on the

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - A new oxide breakdown degradation phenomenon in CMOS transistors

✍ Teong-San Yeoh, ; Shze-Jer Hu, 📂 Article 📅 1995 🏛 IEEE ⚖ 331 KB

[IEEE 5th International Symposium on the

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - A study of integrated circuit I-V characteristics using a fault localization system [FLS]

✍ Quah, L.T.S.; Wong, W.K.; Phang, J.C.H.; Chan, D.S.H.; Ho, P.Y.S. 📂 Article 📅 1995 🏛 IEEE ⚖ 512 KB

[IEEE 5th International Symposium on the

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - The related effects of increased PN junction area on ESD protection capability

✍ Liu Po-Ching, ; Lee, B.; Eng Aik Lian, ; Gan Cheong Hock, ; Wang Haibo, 📂 Article 📅 1995 🏛 IEEE ⚖ 651 KB

[IEEE 5th International Symposium on the

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Imaging of charging specimens at high beam energies in the SEM

✍ Wong, W.K.; Phang, J.C.H.; Thong, J.T.L. 📂 Article 📅 1995 🏛 IEEE ⚖ 572 KB

[IEEE 5th International Symposium on the

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs

✍ Lou, C.L.; Chim, W.K.; Chan, D.S.H.; Pan, Y. 📂 Article 📅 1995 🏛 IEEE ⚖ 383 KB