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[IEEE 38th Electronics Components Conference 1988., Proceedings. - Los Angeles, CA, USA (9-11 May 1988)] 38th Electronics Components Conference 1988., Proceedings. - A limited study of the effects of contact normal force, contact geometry and wipe distance on contact resistance of gold-plated contacts

✍ Scribed by Brockman, I.H.; Sieber, C.S.; Mroczkowski, R.S.

Book ID: 121325744
Publisher: IEEE
Year: 1988
Weight: 984 KB
Category: Article
DOI: 10.1109/ECC.1988.12594

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