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[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - BIST for Network-on-Chip Interconnect Infrastructures

✍ Scribed by Grecu, C.; Pande, P.; Ivanov, A.; Saleh, R.

No coin nor oath required. For personal study only.

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