✦ LIBER ✦

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Comprehensive online defect diagnosis in on-chip networks

✍ Scribed by Ghofrani, Amirali; Parikh, Ritesh; Shamshiri, Saeed; DeOrio, Andrew; Cheng, Kwang-Ting; Bertacco, Valeria

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitch, S.; Virazel, A. 📂 Article 📅 2012 🏛 IEEE ⚖ 101 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Lee, Patricia S.; Harris, Ian G. 📂 Article 📅 2012 🏛 IEEE ⚖ 443 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Zamani, Masoud; Tahoori, Mehdi B.; Chakrabarty, Krishnendu 📂 Article 📅 2012 🏛 IEEE ⚖ 622 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Prasanth, V; Singh, Virendra; Parekhji, Rubin 📂 Article 📅 2012 🏛 IEEE ⚖ 847 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Da Rolt, Jean; Di Natale, Giorgio; Flottes, Marie-Lise; Rouzeyre, Bruno 📂 Article 📅 2012 🏛 IEEE ⚖ 873 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Galarza-Medina, Francisco J.; Garcia-Gervacio, Jose L.; Champac, Victor; Orailog 📂 Article 📅 2012 🏛 IEEE ⚖ 751 KB