✦ LIBER ✦

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Test generation for subtractive specification errors

✍ Scribed by Lee, Patricia S.; Harris, Ian G.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitch, S.; Virazel, A. 📂 Article 📅 2012 🏛 IEEE ⚖ 101 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Zamani, Masoud; Tahoori, Mehdi B.; Chakrabarty, Krishnendu 📂 Article 📅 2012 🏛 IEEE ⚖ 622 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Ghofrani, Amirali; Parikh, Ritesh; Shamshiri, Saeed; DeOrio, Andrew; Cheng, Kwan 📂 Article 📅 2012 🏛 IEEE ⚖ 899 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Prasanth, V; Singh, Virendra; Parekhji, Rubin 📂 Article 📅 2012 🏛 IEEE ⚖ 847 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Da Rolt, Jean; Di Natale, Giorgio; Flottes, Marie-Lise; Rouzeyre, Bruno 📂 Article 📅 2012 🏛 IEEE ⚖ 873 KB

[IEEE 2012 IEEE 30th VLSI Test Symposium

✍ Huang, Jiun-Lang; Huang, X.-L.; Chou, Y.-F.; Kwai, D.-M. 📂 Article 📅 2012 🏛 IEEE ⚖ 474 KB