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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - A SAR ADC missing-decision level detection and removal technique

✍ Scribed by Huang, Jiun-Lang; Huang, X.-L.; Chou, Y.-F.; Kwai, D.-M.

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