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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Advanced test methods for SRAMs

✍ Scribed by Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitch, S.; Virazel, A.

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