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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Are advanced DfT structures sufficient for preventing scan-attacks?

✍ Scribed by Da Rolt, Jean; Di Natale, Giorgio; Flottes, Marie-Lise; Rouzeyre, Bruno

No coin nor oath required. For personal study only.

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