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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Derating based hardware optimizations in soft error tolerant designs

✍ Scribed by Prasanth, V; Singh, Virendra; Parekhji, Rubin

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