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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Small-delay defects detection under process variation using Inter-Path Correlation

✍ Scribed by Galarza-Medina, Francisco J.; Garcia-Gervacio, Jose L.; Champac, Victor; Orailoglu, Alex

No coin nor oath required. For personal study only.

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