✦ LIBER ✦

[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors

✍ Scribed by Natarajan, V.; Bhattacharya, S.; Chatterjee, A.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 24th IEEE VLSI Test Symposium - Be

✍ Stewart, K.; Tragoudas, S. 📂 Article 📅 2006 🏛 IEEE ⚖ 313 KB

[IEEE 24th IEEE VLSI Test Symposium - Be

✍ Grecu, C.; Pande, P.; Ivanov, A.; Saleh, R. 📂 Article 📅 2006 🏛 IEEE ⚖ 323 KB

[IEEE 24th IEEE VLSI Test Symposium - Be

✍ Datta, R.; Carpenter, G.; Nowka, K.; Abraham, J.A. 📂 Article 📅 2006 🏛 IEEE ⚖ 306 KB

[IEEE 24th IEEE VLSI Test Symposium - Be

✍ Appello, D.; Tancorre, V.; Bernardi, P.; Grosso, M.; Rebaudengo, M.; Reorda, M.S 📂 Article 📅 2006 🏛 IEEE ⚖ 375 KB

[IEEE 24th IEEE VLSI Test Symposium - Be

✍ Hongjoong Shin, ; Byoungho Kim, ; Abraham, J.A. 📂 Article 📅 2006 🏛 IEEE ⚖ 681 KB

[IEEE Comput. Soc 16th IEEE VLSI Test Sy

✍ Rajski, J.; Tyszer, J. 📂 Article 📅 1998 🏛 IEEE Comput. Soc 🌐 English ⚖ 205 KB