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[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits

✍ Scribed by Hongjoong Shin, ; Byoungho Kim, ; Abraham, J.A.

No coin nor oath required. For personal study only.

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