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[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - On the Automation of the Test Flow of Complex SoCs

✍ Scribed by Appello, D.; Tancorre, V.; Bernardi, P.; Grosso, M.; Rebaudengo, M.; Reorda, M.S.

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