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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model

✍ Scribed by Alaghi, Armin; Karimi, Naghmeh; Sedghi, Mahshid; Navabi, Zainalabedin

Book ID: 118028259
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 463 KB
Volume: 0
Category: Article
ISBN-13: 9780769528854
DOI: 10.1109/dft.2007.55

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