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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Estimating Error Propagation Probabilities with Bounded Variances

✍ Scribed by Asadi, Hossein; Tahoori, Mehdi B.; Tirumurti, Chandra

Book ID: 115525580
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 246 KB
Volume: 0
Category: Article
ISBN-13: 9780769528854
DOI: 10.1109/dft.2007.51

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