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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Matrix Codes: Multiple Bit Upsets Tolerant Method for SRAM Memories

✍ Scribed by Argyrides, Costas; Zarandi, Hamid R.; Pradhan, Dhiraj K.

Book ID: 118223707
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 514 KB
Volume: 0
Category: Article
ISBN-13: 9780769528854
DOI: 10.1109/dft.2007.29

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