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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs

✍ Scribed by Manuzz, A.; Rech, P.; Gerardin, S.; Paccagnella, A.; Sterpone, L.; Violante, M.

Book ID: 111910818
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 380 KB
Volume: 0
Category: Article
ISBN-13: 9780769528854
DOI: 10.1109/dft.2007.57

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