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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Evaluation of Single Event Upset Mitigation Schemes for SRAM based FPGAs using the FLIPPER Fault Injection Platform

✍ Scribed by Alderighi, M.; Casini, F.; D'Angelo, S.; Pastore, S.; Sechi, G.R.; Weigand, R.

Book ID: 115523418
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 538 KB
Volume: 0
Category: Article
ISBN-13: 9780769528854
DOI: 10.1109/dft.2007.45

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