𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - A Functional Verification based Fault Injection Environment

✍ Scribed by Benso, A.; Bosio, A.; Carlo, S. Di; Mariani, R.

Book ID: 120440680
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 359 KB
Category: Article
ISBN-13: 9780769528854
DOI: 10.1109/DFT.2007.31

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 22nd IEEE International Symposium

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Fault Secure Encoder and Decoder for Memory Applications

✍ Naeimi, Helia; DeHon, Andre 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 445 KB

[IEEE 22nd IEEE International Symposium

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Fault Tolerant Arithmetic Operations with Multiple Error Detection and Correction

✍ Valinataj, Mojtaba; Safari, Saeed 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 311 KB

[IEEE 22nd IEEE International Symposium

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Estimating Error Propagation Probabilities with Bounded Variances

✍ Asadi, Hossein; Tahoori, Mehdi B.; Tirumurti, Chandra 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 246 KB

[IEEE 22nd IEEE International Symposium

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Matrix Codes: Multiple Bit Upsets Tolerant Method for SRAM Memories

✍ Argyrides, Costas; Zarandi, Hamid R.; Pradhan, Dhiraj K. 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 514 KB

[IEEE 22nd IEEE International Symposium

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - TMR and Partial Dynamic Reconfiguration to mitigate SEU faults in FPGAs

✍ Bolchini, Cristiana; Miele, Antonio; Santambrogio, Marco D. 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 277 KB

[IEEE 22nd IEEE International Symposium

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model

✍ Alaghi, Armin; Karimi, Naghmeh; Sedghi, Mahshid; Navabi, Zainalabedin 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 463 KB