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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - TMR and Partial Dynamic Reconfiguration to mitigate SEU faults in FPGAs

✍ Scribed by Bolchini, Cristiana; Miele, Antonio; Santambrogio, Marco D.

Book ID: 120078961
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 277 KB
Category: Article
ISBN-13: 9780769528854
DOI: 10.1109/DFT.2007.25

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