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[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - BIST for logic and local interconnect resources in a novel mesh of cluster FPGA

✍ Scribed by Rehman, Saif-Ur; Benabdenbi, Mounir; Anghel, Lorena

Book ID: 127219116
Publisher: IEEE
Year: 2013
Weight: 784 KB
Category: Article
ISBN: 1479915831
DOI: 10.1109/dft.2013.6653622

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