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[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - A fast TCAD-based methodology for Variation analysis of emerging nano-devices

✍ Scribed by Mohammadi, Hassan Ghasemzadeh; Gaillardon, Pierre-Emmanuel; Yazdani, Majid; De Micheli, Giovanni

Book ID: 126594007
Publisher: IEEE
Year: 2013
Weight: 594 KB
Category: Article
ISBN: 1479915831
DOI: 10.1109/DFT.2013.6653587

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