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[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Run-time mapping for reliable many-cores based on energy/performance trade-offs

✍ Scribed by Bolchini, C.; Carminati, M.; Miele, A.; Das, A.; Kumar, A.; Veeravalli, B.

Book ID: 125888450
Publisher: IEEE
Year: 2013
Weight: 237 KB
Category: Article
ISBN: 1479915831
DOI: 10.1109/DFT.2013.6653583

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