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[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Built-in Self-Repair in a 3D die stack using programmable logic

✍ Scribed by Nepal, Kundan; Shen, Xi; Dworak, Jennifer; Manikas, Theodore; Bahar, R. Iris

Book ID: 126646363
Publisher: IEEE
Year: 2013
Weight: 225 KB
Category: Article
ISBN: 1479915831
DOI: 10.1109/DFT.2013.6653613

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