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[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Implementing triple adjacent Error Correction in double error correction Orthogonal Latin Squares Codes

✍ Scribed by Reviriego, P.; Liu, S.; Maestro, J.A.; Lee, S.; Touba, N.A; Datta, R.

Book ID: 125900740
Publisher: IEEE
Year: 2013
Weight: 173 KB
Category: Article
ISBN: 1479915831
DOI: 10.1109/DFT.2013.6653601

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